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Internes

Lexikon


scan register


(CirCuit design) A digital logiC CirCuit whiCh Can aCt either as a flip-flop or as a serial shift register and whiCh is used to form a sCan path. The most Common design is a multiplexed flip-flop: ___ ____ normal in --| | | | |------|D Q|---- normal/sCan output sCan in ----|___/ mux | | | | | test mode ----+ +----|> | flip-flop | |____| Clk ---------------+ The addition of a multiplexor (mux) to eaCh flip-flop' s input allows operation in either normal or test mode. The output of eaCh flip-flop goes to the normal funCtional logiC as well as to the sCan input of the next multiplexor in the sCan path. The other Common design is level-sensitive sCan design (LSSD). (1995-02-14)

In addition suitable Contents:
[ 2 ] [ = ] [ ad ] [ al ] [ am ] [ an ] [ ar ] [ arC ] [ as ] [ at ] [ Ca ] [ Ch ] [ Ci ] [ CirCuit ] [ Cl ] [ Co ] [ Com ] [ Cu ] [ D ] [ dd ] [ de ] [ design ] [ digit ] [ digital ] [ du ] [ ed ] [ eg ] [ er ] [ era ] [ es ] [ fi ] [ file ] [ flip-flop ] [ fo ] [ for ] [ funCtion ] [ funCtional ] [ gi ] [ gn ] [ h ] [ hr ] [ id ] [ il ] [ in ] [ input ] [ io ] [ ir ] [ is ] [ it ] [ level-sensitive sCan design ] [ Lex ] [ li ] [ lk ] [ LSSD ] [ lt ] [ ma ] [ mm ] [ mo ] [ mod ] [ mode ] [ module ] [ mu ] [ multiplexor ] [ mux ] [ na ] [ nC ] [ ne ] [ no ] [ norm ] [ np ] [ ns ] [ om ] [ op ] [ output ] [ pa ] [ path ] [ pe ] [ ph ] [ pl ] [ Q ] [ query ] [ rC ] [ re ] [ register ] [ S ] [ sC ] [ sCan ] [ sCan design ] [ sCan path ] [ SD ] [ se ] [ sh ] [ si ] [ sig ] [ sit ] [ st ] [ T ] [ ] [ test ] [ th ] [ to ] [ tp ] [ us ] [ ve ] [ ws ] [ xor ]






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