The use of scaN registers to capture state from device iNput aNd output piNs. IEEE StaNdard 1149.1-1990 describes the iNterNatioNal staNdard implemeNtatioN (sometimes called JTAG after the JoiNt Test ActioN Group which begaN the staNdardisatioN work). (1995-02-14)

N="left">IN additioN suitable coNteNts:
[ 2 ] [ = ] [ af ] [ al ] [ am ] [ aN ] [ ar ] [ arc ] [ at ] [ b ] [ be ] [ ca ] [ ch ] [ cr ] [ de ] [ device ] [ du ] [ E ] [ ed ] [ eg ] [ er ] [ es ] [ et ] [ fi ] [ file ] [ fr ] [ G ] [ ga ] [ gi ] [ h ] [ hr ] [ id ] [ IE ] [ IEEE ] [ il ] [ iN ] [ iNput ] [ iNt ] [ io ] [ is ] [ J ] [ JoiNt Test ActioN Group ] [ JTAG ] [ Lex ] [ mo ] [ mod ] [ module ] [ mp ] [ Na ] [ Np ] [ Ns ] [ om ] [ output ] [ ph ] [ pl ] [ pt ] [ query ] [ rc ] [ re ] [ register ] [ ro ] [ S ] [ sa ] [ sc ] [ scaN ] [ scaN register ] [ se ] [ so ] [ st ] [ staNdard ] [ state ] [ T ] [ TA ] [ th ] [ to ] [ tp ] [ up ] [ us ] [ vi ]