Built-in Self Test
(BI sT) The technique of de signing circuit s with additional logic which can be u sed to te st proper operation of the primary (functional) logic. (1995-02-14) style="border-width:thin; border-color:#333333; border-style:dashed; padding:5px;" align="left">In addition suitable contents: [ 2 ] [ ad ] [ al ] [ an ] [ ar ] [ at ] [ B ] [ b ] [ be ] [ BIsT ] [ ca ] [ ch ] [ ci ] [ circuit ] [ cu ] [ dd ] [ de ] [ design ] [ ec ] [ ed ] [ er ] [ era ] [ es ] [ function ] [ functional ] [ gi ] [ gn ] [ h ] [ hn ] [ in ] [ io ] [ iq ] [ ir ] [ Is ] [ IsT ] [ it ] [ ma ] [ na ] [ nc ] [ ng ] [ ni ] [ op ] [ pe ] [ pr ] [ rc ] [ ro ] [ s ] [ se ] [ si ] [ sig ] [ st ] [ T ] [ test ] [ th ] [ to ] [ us ]
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